%0 Journal Article %1 tolpygo:063904 %A Tolpygo, Sergey K. %A Amparo, Denis %D 2008 %I AIP %J Journal of Applied Physics %K Josephson_effect SQUIDs aluminium aluminium_compounds critical_currents electric_breakdown electromechanical_effects niobium quantum_point_contacts superconducting_integrated_circuits superconducting_materials transparency %N 6 %P 063904 %R 10.1063/1.2977725 %T Electrical stress effect on Josephson tunneling through ultrathin AlOsub x barrier in Nb/Al/AlOsub x/Nb junctions %U http://link.aip.org/link/?JAP/104/063904/1 %V 104

@article{tolpygo:063904, added-at = {2008-09-19T22:51:24.000+0200}, author = {Tolpygo, Sergey K. and Amparo, Denis}, biburl = {https://www.bibsonomy.org/bibtex/25148028ed2eacd44600d1b5293322597/djca}, description = {Electrical stress effect on Josephson tunneling through ultrathin AlO[sub x] barrier in Nb/Al/AlO[sub x]/Nb junctions}, doi = {10.1063/1.2977725}, eid = {063904}, interhash = {a2e0d23cae2a3ed1cf0095c787ecbd92}, intrahash = {5148028ed2eacd44600d1b5293322597}, journal = {Journal of Applied Physics}, keywords = {Josephson_effect SQUIDs aluminium aluminium_compounds critical_currents electric_breakdown electromechanical_effects niobium quantum_point_contacts superconducting_integrated_circuits superconducting_materials transparency}, number = 6, numpages = {10}, pages = 063904, publisher = {AIP}, timestamp = {2008-09-19T22:51:24.000+0200}, title = {Electrical stress effect on Josephson tunneling through ultrathin AlO[sub x] barrier in Nb/Al/AlO[sub x]/Nb junctions}, url = {http://link.aip.org/link/?JAP/104/063904/1}, volume = 104, year = 2008 }