%0 Conference Paper %1 conf/vts/ZhangRPLR06 %A Zhang, Zhuo %A Reddy, Sudhakar M. %A Pomeranz, Irith %A Lin, Xijiang %A Rajski, Janusz %B VTS %D 2006 %I IEEE Computer Society %K dblp %P 343-348 %T Scan Tests with Multiple Fault Activation Cycles for Delay Faults. %U http://dblp.uni-trier.de/db/conf/vts/vts2006.html#ZhangRPLR06 %@ 0-7695-2514-8

@inproceedings{conf/vts/ZhangRPLR06, added-at = {2023-03-24T00:00:00.000+0100}, author = {Zhang, Zhuo and Reddy, Sudhakar M. and Pomeranz, Irith and Lin, Xijiang and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/25eb7e845c3df8766325f3194b27ea514/dblp}, booktitle = {VTS}, crossref = {conf/vts/2006}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTS.2006.91}, interhash = {a45b5d92b955398d272df703639b0cf8}, intrahash = {5eb7e845c3df8766325f3194b27ea514}, isbn = {0-7695-2514-8}, keywords = {dblp}, pages = {343-348}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:45:48.000+0200}, title = {Scan Tests with Multiple Fault Activation Cycles for Delay Faults.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2006.html#ZhangRPLR06}, year = 2006 }