Comprehensive error analysis of combined channel mismatch effects in time-interleaved ADCs
Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference. IMTC '03., 1, page 733--738. (May 2003)Abstract
A time-interleaved analog-to-digital converter (ADC) achieves high sampling rates with the drawback of additional distortions caused by channel mismatches. In this paper we consider the dependency of the signal-to-noise-and-distortion ratio (SINAD) on all of these mismatch effects together. By using either explicitly given mismatch parameters or given parameter distributions we derive closed-form equations for calculating the explicit or the expected SINAD for an arbitrary number of channels. We clarify how channel mismatches interact and perform worst case estimations of the explicit SINAD for individual mismatch errors. We also show that equations describing the expected SINAD of individual mismatch errors are special cases of our general formulation.