%0 Conference Paper %1 conf/vts/BurchardERS017 %A Burchard, Jan %A Erb, Dominik %A Reddy, Sudhakar M. %A Singh, Adit D. %A Becker, Bernd %B VTS %D 2017 %I IEEE Computer Society %K dblp %P 1-6 %T Efficient SAT-based generation of hazard-activated TSOF tests. %U http://dblp.uni-trier.de/db/conf/vts/vts2017.html#BurchardERS017 %@ 978-1-5090-4482-5

@inproceedings{conf/vts/BurchardERS017, added-at = {2023-03-24T00:00:00.000+0100}, author = {Burchard, Jan and Erb, Dominik and Reddy, Sudhakar M. and Singh, Adit D. and Becker, Bernd}, biburl = {https://www.bibsonomy.org/bibtex/271052dccb2365357d4fc89218d8702f4/dblp}, booktitle = {VTS}, crossref = {conf/vts/2017}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTS.2017.7928943}, interhash = {cfe52c069b51bc7f61c1cea0391b08bf}, intrahash = {71052dccb2365357d4fc89218d8702f4}, isbn = {978-1-5090-4482-5}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:42:17.000+0200}, title = {Efficient SAT-based generation of hazard-activated TSOF tests.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2017.html#BurchardERS017}, year = 2017 }