%0 Journal Article %1 journals/tcad/HwangM86 %A Hwang, Ki Soo %A Mercer, M. Ray %D 1986 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 4 %P 564-572 %T Derivation and Refinement of Fan-Out Constraints to Generate Tests in Combinational Logic Circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad5.html#HwangM86 %V 5

@article{journals/tcad/HwangM86, added-at = {2020-09-24T00:00:00.000+0200}, author = {Hwang, Ki Soo and Mercer, M. Ray}, biburl = {https://www.bibsonomy.org/bibtex/277df195f147da481ef32aac47b64901c/dblp}, ee = {https://doi.org/10.1109/TCAD.1986.1270227}, interhash = {79028070e3273fcaac75072a7e05e462}, intrahash = {77df195f147da481ef32aac47b64901c}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 4, pages = {564-572}, timestamp = {2020-09-25T11:46:16.000+0200}, title = {Derivation and Refinement of Fan-Out Constraints to Generate Tests in Combinational Logic Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad5.html#HwangM86}, volume = 5, year = 1986 }