%0 Conference Paper %1 conf/isvlsi/LiTLPTO18 %A Li, Yongfu %A Tseng, I-Lun %A Lee, Zhao Chuan %A Perez, Valerio %A Tripathi, Vikas %A Ong, Yoong Seang Jonathan %B ISVLSI %D 2018 %I IEEE Computer Society %K dblp %P 417-422 %T Identifying Lithography Weak-Points of Standard Cells with Partial Pattern Matching. %U http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2018.html#LiTLPTO18 %@ 978-1-5386-7099-6

@inproceedings{conf/isvlsi/LiTLPTO18, added-at = {2023-03-24T00:00:00.000+0100}, author = {Li, Yongfu and Tseng, I-Lun and Lee, Zhao Chuan and Perez, Valerio and Tripathi, Vikas and Ong, Yoong Seang Jonathan}, biburl = {https://www.bibsonomy.org/bibtex/27df8f92a3f1d2f7c4b5bd0027fd50456/dblp}, booktitle = {ISVLSI}, crossref = {conf/isvlsi/2018}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISVLSI.2018.00082}, interhash = {9c2bf1f26e36790dc5e97e4e7a8ca327}, intrahash = {7df8f92a3f1d2f7c4b5bd0027fd50456}, isbn = {978-1-5386-7099-6}, keywords = {dblp}, pages = {417-422}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T11:08:32.000+0200}, title = {Identifying Lithography Weak-Points of Standard Cells with Partial Pattern Matching.}, url = {http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2018.html#LiTLPTO18}, year = 2018 }