%0 Conference Paper %1 conf/fpl/AhmedZMTB18 %A Ahmed, Ibrahim %A Zhao, Shuze %A Meijers, James %A Trescases, Olivier %A Betz, Vaughn %B FPL %D 2018 %I IEEE Computer Society %K dblp %P 68-75 %T Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs. %U http://dblp.uni-trier.de/db/conf/fpl/fpl2018.html#AhmedZMTB18 %@ 978-1-5386-8517-4

@inproceedings{conf/fpl/AhmedZMTB18, added-at = {2019-02-18T00:00:00.000+0100}, author = {Ahmed, Ibrahim and Zhao, Shuze and Meijers, James and Trescases, Olivier and Betz, Vaughn}, biburl = {https://www.bibsonomy.org/bibtex/2967b9c221f6b5e6fb00950faf9fdae48/dblp}, booktitle = {FPL}, crossref = {conf/fpl/2018}, ee = {https://doi.org/10.1109/FPL.2018.00020}, interhash = {c29dd4affcd6d169c58b572486422ded}, intrahash = {967b9c221f6b5e6fb00950faf9fdae48}, isbn = {978-1-5386-8517-4}, keywords = {dblp}, pages = {68-75}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T19:13:56.000+0200}, title = {Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs.}, url = {http://dblp.uni-trier.de/db/conf/fpl/fpl2018.html#AhmedZMTB18}, year = 2018 }