Progress is reported towards the development of a new route to obtain
cadmium sulfide (CdS) thin films by using ethylene-diamine-tetra-acetic
acid (EDTA) ligand on the chemical bath deposition (CBD) method.
Different chemical baths are used to study changes in the structures of
the US films for different EDTA concentrations. X-ray diffraction (XRD)
is used to prove the structural characterization of the samples, and to
obtain the grain size with the Scherrer's equation. The pH variations
during the growth also affect the structural film quality, and it was
verified by using ammonia chloride as an auxiliar-buffer plus
Triton-X100.
%0 Journal Article
%1 WOS:000223138500035
%A Feitosa, AV
%A Miranda, MAR
%A Sasaki, JM
%A Araujo-Silva, MA
%C CAIXA POSTAL 66328, 05315-970 SAO PAULO, BRAZIL
%D 2004
%I SOCIEDADE BRASILEIRA FISICA
%J BRAZILIAN JOURNAL OF PHYSICS
%K imported
%N 2B
%P 656-658
%R 10.1590/S0103-97332004000400034
%T A new route for preparing CdS thin films by chemical bath deposition
using EDTA as ligand
%V 34
%X Progress is reported towards the development of a new route to obtain
cadmium sulfide (CdS) thin films by using ethylene-diamine-tetra-acetic
acid (EDTA) ligand on the chemical bath deposition (CBD) method.
Different chemical baths are used to study changes in the structures of
the US films for different EDTA concentrations. X-ray diffraction (XRD)
is used to prove the structural characterization of the samples, and to
obtain the grain size with the Scherrer's equation. The pH variations
during the growth also affect the structural film quality, and it was
verified by using ammonia chloride as an auxiliar-buffer plus
Triton-X100.
@article{WOS:000223138500035,
abstract = {Progress is reported towards the development of a new route to obtain
cadmium sulfide (CdS) thin films by using ethylene-diamine-tetra-acetic
acid (EDTA) ligand on the chemical bath deposition (CBD) method.
Different chemical baths are used to study changes in the structures of
the US films for different EDTA concentrations. X-ray diffraction (XRD)
is used to prove the structural characterization of the samples, and to
obtain the grain size with the Scherrer's equation. The pH variations
during the growth also affect the structural film quality, and it was
verified by using ammonia chloride as an auxiliar-buffer plus
Triton-X100.},
added-at = {2022-05-23T20:00:14.000+0200},
address = {CAIXA POSTAL 66328, 05315-970 SAO PAULO, BRAZIL},
author = {Feitosa, AV and Miranda, MAR and Sasaki, JM and Araujo-Silva, MA},
biburl = {https://www.bibsonomy.org/bibtex/299f522e006a3d4b99adf8996f5ecb0bb/ppgfis_ufc_br},
doi = {10.1590/S0103-97332004000400034},
interhash = {c09c68605d6b014e701a78fbf010a176},
intrahash = {99f522e006a3d4b99adf8996f5ecb0bb},
issn = {0103-9733},
journal = {BRAZILIAN JOURNAL OF PHYSICS},
keywords = {imported},
note = {11th Brazilian Workshop on Semiconductor Physics, Fortaleza, BRAZIL, MAR
09-14, 2003},
number = {2B},
pages = {656-658},
publisher = {SOCIEDADE BRASILEIRA FISICA},
pubstate = {published},
timestamp = {2022-05-23T20:00:14.000+0200},
title = {A new route for preparing CdS thin films by chemical bath deposition
using EDTA as ligand},
tppubtype = {article},
volume = 34,
year = 2004
}