%0 Conference Paper %1 conf/issre/BaudrySJ01 %A Baudry, Benoit %A Traon, Yves Le %A Sunyé, Gerson %A Jézéquel, Jean-Marc %B ISSRE %D 2001 %I IEEE Computer Society %K dblp %P 324-331 %T Towards a 'Safe' Use of Design Patterns to Improve OO Software Testability. %U http://dblp.uni-trier.de/db/conf/issre/issre2001.html#BaudrySJ01 %@ 0-7695-1306-9

@inproceedings{conf/issre/BaudrySJ01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Baudry, Benoit and Traon, Yves Le and Sunyé, Gerson and Jézéquel, Jean-Marc}, biburl = {https://www.bibsonomy.org/bibtex/2a2721fdd0d8558dbb268fb8460dfe50a/dblp}, booktitle = {ISSRE}, crossref = {conf/issre/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISSRE.2001.989486}, interhash = {aae6a431f22d14f34b23a8f10e3d2049}, intrahash = {a2721fdd0d8558dbb268fb8460dfe50a}, isbn = {0-7695-1306-9}, keywords = {dblp}, pages = {324-331}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:51:22.000+0200}, title = {Towards a 'Safe' Use of Design Patterns to Improve OO Software Testability.}, url = {http://dblp.uni-trier.de/db/conf/issre/issre2001.html#BaudrySJ01}, year = 2001 }