C. Teh, and R. Chin. IEEE Transactions on Pattern Analysis and Machine Intelligence, 10 (4):
496--513(1988)
Abstract
Various types of moments have been used to recognize image patterns
in a number of applications. A number of moments are evaluated and
some fundamental questions are addressed, such as image-representation
ability, noise sensitivity, and information redundancy. Moments considered
include regular moments, Legendre moments, Zernike moments, pseudo-Zernike
moments, rotational moments, and complex moments. Properties of these
moments are examined in detail and the interrelationships among them
are discussed. Both theoretical and experimental results are presented.
%0 Journal Article
%1 Teh1988
%A Teh, C. H.
%A Chin, R. T.
%D 1988
%J IEEE Transactions on Pattern Analysis and Machine Intelligence
%K imported
%N 4
%P 496--513
%T On image analysis by the method of moments
%U http://ieeexplore.ieee.org/xpls/abs\_all.jsp?arnumber=3913
%V 10
%X Various types of moments have been used to recognize image patterns
in a number of applications. A number of moments are evaluated and
some fundamental questions are addressed, such as image-representation
ability, noise sensitivity, and information redundancy. Moments considered
include regular moments, Legendre moments, Zernike moments, pseudo-Zernike
moments, rotational moments, and complex moments. Properties of these
moments are examined in detail and the interrelationships among them
are discussed. Both theoretical and experimental results are presented.
@article{Teh1988,
abstract = {Various types of moments have been used to recognize image patterns
in a number of applications. A number of moments are evaluated and
some fundamental questions are addressed, such as image-representation
ability, noise sensitivity, and information redundancy. Moments considered
include regular moments, Legendre moments, Zernike moments, pseudo-Zernike
moments, rotational moments, and complex moments. Properties of these
moments are examined in detail and the interrelationships among them
are discussed. Both theoretical and experimental results are presented.},
added-at = {2011-03-27T19:47:06.000+0200},
author = {Teh, C. H. and Chin, R. T.},
biburl = {https://www.bibsonomy.org/bibtex/2cbe2b8715614f0cf9d409040bb0bf6a0/cocus},
citeulike-article-id = {812357},
interhash = {8da8a0cd86b53acff67acf4b984c6de3},
intrahash = {cbe2b8715614f0cf9d409040bb0bf6a0},
journal = {{IEEE} Transactions on Pattern Analysis and Machine Intelligence},
keywords = {imported},
number = 4,
owner = {CK},
pages = {496--513},
timestamp = {2011-03-27T19:47:09.000+0200},
title = {On image analysis by the method of moments},
url = {http://ieeexplore.ieee.org/xpls/abs\_all.jsp?arnumber=3913},
volume = 10,
year = 1988
}