%0 Journal Article %1 journals/mr/FischerS15 %A Fischer, Gerhard G. %A Sasso, Grazia %D 2015 %J Microelectron. Reliab. %K dblp %N 3-4 %P 498-507 %T Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#FischerS15 %V 55

@article{journals/mr/FischerS15, added-at = {2023-03-06T00:00:00.000+0100}, author = {Fischer, Gerhard G. and Sasso, Grazia}, biburl = {https://www.bibsonomy.org/bibtex/2eda95fc167e4f5b694a01677ed78793c/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.12.014}, interhash = {b2895c8aa3515729f6eeb753bc742ddd}, intrahash = {eda95fc167e4f5b694a01677ed78793c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {3-4}, pages = {498-507}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#FischerS15}, volume = 55, year = 2015 }