%0 Conference Paper %1 conf/isqed/BhuniaMGR05 %A Bhunia, Swarup %A Mahmoodi-Meimand, Hamid %A Ghosh, Debjyoti %A Roy, Kaushik %B ISQED %D 2005 %I IEEE Computer Society %K dblp %P 453-458 %T Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2005.html#BhuniaMGR05 %@ 0-7695-2301-3

@inproceedings{conf/isqed/BhuniaMGR05, added-at = {2024-05-07T00:00:00.000+0200}, author = {Bhunia, Swarup and Mahmoodi-Meimand, Hamid and Ghosh, Debjyoti and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2fd75247c205423f2f5c02910b4fac970/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISQED.2005.96}, interhash = {64968823a4f33f78e12863a8b93ddf87}, intrahash = {fd75247c205423f2f5c02910b4fac970}, isbn = {0-7695-2301-3}, keywords = {dblp}, pages = {453-458}, publisher = {IEEE Computer Society}, timestamp = {2024-05-13T09:24:01.000+0200}, title = {Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2005.html#BhuniaMGR05}, year = 2005 }