%0 Conference Paper %1 conf/ets/0011RPREB05 %A Chen, Gang %A Reddy, Sudhakar M. %A Pomeranz, Irith %A Rajski, Janusz %A Engelke, Piet %A Becker, Bernd %B European Test Symposium %D 2005 %I IEEE Computer Society %K %P 22-27 %T A unified fault model and test generation procedure for interconnect opens and bridges. %U http://dblp.uni-trier.de/db/conf/ets/ets2005.html#0011RPREB05 %@ 0-7695-2341-2

@inproceedings{conf/ets/0011RPREB05, added-at = {2023-12-12T20:54:59.000+0100}, author = {Chen, Gang and Reddy, Sudhakar M. and Pomeranz, Irith and Rajski, Janusz and Engelke, Piet and Becker, Bernd}, biburl = {https://www.bibsonomy.org/bibtex/297231a6a00dbe911063cb2a63364d8e3/admin}, booktitle = {European Test Symposium}, crossref = {conf/ets/2005}, ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2005.6}, interhash = {364ed2c28c9116b2b36785c1d9490c05}, intrahash = {97231a6a00dbe911063cb2a63364d8e3}, isbn = {0-7695-2341-2}, keywords = {}, pages = {22-27}, publisher = {IEEE Computer Society}, timestamp = {2023-12-12T20:54:59.000+0100}, title = {A unified fault model and test generation procedure for interconnect opens and bridges.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2005.html#0011RPREB05}, year = 2005 }