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%0 Journal Article
%1 journals/mr/HelfmeierFG16
%A Helfmeier, Clemens
%A Frieß, Erik
%A Glück, Joachim
%D 2016
%J Microelectron. Reliab.
%K
%P 306-309
%T Static logic state analysis by TLS on powered logic circuits: Three case studies for suspected stuck-at failure modes.
%U http://dblp.uni-trier.de/db/journals/mr/mr64.html#HelfmeierFG16
%V 64
@article{journals/mr/HelfmeierFG16,
added-at = {2023-12-12T20:56:30.000+0100},
author = {Helfmeier, Clemens and Frieß, Erik and Glück, Joachim},
biburl = {https://www.bibsonomy.org/bibtex/25d05d6187790b0c360c093dc26df4085/admin},
ee = {https://doi.org/10.1016/j.microrel.2016.07.111},
interhash = {36b010f936e42bf78c880659efdedb85},
intrahash = {5d05d6187790b0c360c093dc26df4085},
journal = {Microelectron. Reliab.},
keywords = {},
pages = {306-309},
timestamp = {2023-12-12T20:56:30.000+0100},
title = {Static logic state analysis by TLS on powered logic circuits: Three case studies for suspected stuck-at failure modes.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#HelfmeierFG16},
volume = 64,
year = 2016
}