%0 Journal Article %1 journals/ieicet/NakasatoIOF08 %A Nakasato, Masato %A Inoue, Michiko %A Ohtake, Satoshi %A Fujiwara, Hideo %D 2008 %J IEICE Trans. Inf. Syst. %K dblp %N 3 %P 763-770 %T Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet91d.html#NakasatoIOF08 %V 91-D

@article{journals/ieicet/NakasatoIOF08, added-at = {2020-04-11T00:00:00.000+0200}, author = {Nakasato, Masato and Inoue, Michiko and Ohtake, Satoshi and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/28e5466954723691e61dd3bfd46335a7f/dblp}, ee = {https://doi.org/10.1093/ietisy/e91-d.3.763}, interhash = {3aec5939c925e1aa4c5c6c102f377a31}, intrahash = {8e5466954723691e61dd3bfd46335a7f}, journal = {IEICE Trans. Inf. Syst.}, keywords = {dblp}, number = 3, pages = {763-770}, timestamp = {2020-04-14T11:59:10.000+0200}, title = {Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet91d.html#NakasatoIOF08}, volume = {91-D}, year = 2008 }