%0 Conference Paper %1 conf/itc/MurrayH91 %A Murray, Brian T. %A Hayes, John P. %B ITC %D 1991 %I IEEE Computer Society %K dblp %P 748-757 %T Test Propagation Through Modules and Circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc1991.html#MurrayH91 %@ 0-8186-9156-5

@inproceedings{conf/itc/MurrayH91, added-at = {2017-05-24T00:00:00.000+0200}, author = {Murray, Brian T. and Hayes, John P.}, biburl = {https://www.bibsonomy.org/bibtex/201b6e68dcc7f20ad37bf5e10c67dabd5/dblp}, booktitle = {ITC}, crossref = {conf/itc/1991}, ee = {https://doi.org/10.1109/TEST.1991.519740}, interhash = {3eb59ab7774f5a69b5fbec6f1c7e01ed}, intrahash = {01b6e68dcc7f20ad37bf5e10c67dabd5}, isbn = {0-8186-9156-5}, keywords = {dblp}, pages = {748-757}, publisher = {IEEE Computer Society}, timestamp = {2019-02-14T11:45:59.000+0100}, title = {Test Propagation Through Modules and Circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1991.html#MurrayH91}, year = 1991 }