%0 Report %1 SEMATECH2000 %A Blish, Richard %A Durrant, Noel %D 2000 %K imported %T Semiconductor Device Reliability Failure Models

@techreport{SEMATECH2000, added-at = {2013-01-07T16:10:56.000+0100}, author = {Blish, Richard and Durrant, Noel}, biburl = {https://www.bibsonomy.org/bibtex/226ddbbc9204e1068e38ff571fdd71517/olivia.bluder}, file = {:P\:\\KAI_AP2\\People\\Plankensteiner\\DISS\\Literature_lifetimeModels\\SemiconductorDeviceRelFailureModels_2000.pdf:PDF}, institution = {International SEMATECH}, interhash = {40c15f7e20391c2c3ecf99cf5bb1e70a}, intrahash = {26ddbbc9204e1068e38ff571fdd71517}, keywords = {imported}, owner = {plankensteiner}, timestamp = {2013-01-07T16:10:56.000+0100}, title = {Semiconductor Device Reliability Failure Models}, year = 2000 }