%0 Journal Article %1 journals/mj/GeGXZZLJLLS19 %A Ge, X. %A Gao, Wen %A Xu, Feng %A Zhao, Chen %A Zhao, Yang %A Li, X. %A Jiang, D. %A Liu, H. %A Li, Y. %A Sun, G. %D 2019 %J Microelectron. J. %K dblp %P 65-72 %T Total-ionization-dose characterization of a radiation-hardened mixed-signal microcontroller SoC in 180 nm CMOS technology for nanosatellites. %U http://dblp.uni-trier.de/db/journals/mj/mj87.html#GeGXZZLJLLS19 %V 87

@article{journals/mj/GeGXZZLJLLS19, added-at = {2023-01-26T00:00:00.000+0100}, author = {Ge, X. and Gao, Wen and Xu, Feng and Zhao, Chen and Zhao, Yang and Li, X. and Jiang, D. and Liu, H. and Li, Y. and Sun, G.}, biburl = {https://www.bibsonomy.org/bibtex/256838249742724a7fc0b5b9625d5db01/dblp}, ee = {https://doi.org/10.1016/j.mejo.2019.04.007}, interhash = {476711cfc3215d992f3f9f7025d9b5af}, intrahash = {56838249742724a7fc0b5b9625d5db01}, journal = {Microelectron. J.}, keywords = {dblp}, pages = {65-72}, timestamp = {2024-04-08T21:37:07.000+0200}, title = {Total-ionization-dose characterization of a radiation-hardened mixed-signal microcontroller SoC in 180 nm CMOS technology for nanosatellites.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj87.html#GeGXZZLJLLS19}, volume = 87, year = 2019 }