%0 Journal Article %1 journals/et/ViilukasKRJUF12 %A Viilukas, Taavi %A Karputkin, Anton %A Raik, Jaan %A Jenihhin, Maksim %A Ubar, Raimund %A Fujiwara, Hideo %D 2012 %J J. Electron. Test. %K dblp %N 4 %P 511-521 %T Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints. %U http://dblp.uni-trier.de/db/journals/et/et28.html#ViilukasKRJUF12 %V 28

@article{journals/et/ViilukasKRJUF12, added-at = {2020-10-26T00:00:00.000+0100}, author = {Viilukas, Taavi and Karputkin, Anton and Raik, Jaan and Jenihhin, Maksim and Ubar, Raimund and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2b89b478da5a6f5fb664eeb360d472583/dblp}, ee = {https://doi.org/10.1007/s10836-012-5312-5}, interhash = {519504d009540618ec72f7299c7825e0}, intrahash = {b89b478da5a6f5fb664eeb360d472583}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 4, pages = {511-521}, timestamp = {2020-10-27T12:28:39.000+0100}, title = {Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints.}, url = {http://dblp.uni-trier.de/db/journals/et/et28.html#ViilukasKRJUF12}, volume = 28, year = 2012 }