%0 Journal Article %1 journals/mr/SantiniMFMGA17 %A Santini, Thomas %A Morand, Sébastien %A Fouladirad, Mitra %A Miller, Florent %A Grall, Antoine %A Allard, Bruno %D 2017 %J Microelectron. Reliab. %K dblp %P 14-19 %T Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability. %U http://dblp.uni-trier.de/db/journals/mr/mr75.html#SantiniMFMGA17 %V 75

@article{journals/mr/SantiniMFMGA17, added-at = {2020-02-22T00:00:00.000+0100}, author = {Santini, Thomas and Morand, Sébastien and Fouladirad, Mitra and Miller, Florent and Grall, Antoine and Allard, Bruno}, biburl = {https://www.bibsonomy.org/bibtex/2143f6651ddc1d5131bdcf19e02f38c6a/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.06.007}, interhash = {532e5b02b941d2e738b6e0be22d8e109}, intrahash = {143f6651ddc1d5131bdcf19e02f38c6a}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {14-19}, timestamp = {2020-02-25T13:22:41.000+0100}, title = {Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr75.html#SantiniMFMGA17}, volume = 75, year = 2017 }