%0 Conference Paper %1 conf/ets/HapkeS12 %A Hapke, Friedrich %A Schlöffel, Jürgen %B European Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 1-6 %T Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. %U http://dblp.uni-trier.de/db/conf/ets/ets2012.html#HapkeS12 %@ 978-1-4673-0697-3

@inproceedings{conf/ets/HapkeS12, added-at = {2017-05-22T00:00:00.000+0200}, author = {Hapke, Friedrich and Schlöffel, Jürgen}, biburl = {https://www.bibsonomy.org/bibtex/28e6ca345ba3224e80fef0af787be1063/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2012}, ee = {https://doi.org/10.1109/ETS.2012.6233046}, interhash = {5ab05de0f6cd187526207b5373ef72ea}, intrahash = {8e6ca345ba3224e80fef0af787be1063}, isbn = {978-1-4673-0697-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:59:26.000+0200}, title = {Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2012.html#HapkeS12}, year = 2012 }