%0 Conference Paper %1 conf/ets/KraakTHWCCSWK18 %A Kraak, Daniel %A Taouil, Mottaqiallah %A Hamdioui, Said %A Weckx, Pieter %A Catthoor, Francky %A Chatterjee, Abhijit %A Singh, Adit D. %A Wunderlich, Hans-Joachim %A Karimi, Naghmeh %B ETS %D 2018 %I IEEE %K %P 1-10 %T Device aging: A reliability and security concern. %U http://dblp.uni-trier.de/db/conf/ets/ets2018.html#KraakTHWCCSWK18 %@ 978-1-5386-3728-9

@inproceedings{conf/ets/KraakTHWCCSWK18, added-at = {2023-12-13T00:41:39.000+0100}, author = {Kraak, Daniel and Taouil, Mottaqiallah and Hamdioui, Said and Weckx, Pieter and Catthoor, Francky and Chatterjee, Abhijit and Singh, Adit D. and Wunderlich, Hans-Joachim and Karimi, Naghmeh}, biburl = {https://www.bibsonomy.org/bibtex/258443159d6a52771be860600a362910d/admin}, booktitle = {ETS}, crossref = {conf/ets/2018}, ee = {https://doi.org/10.1109/ETS.2018.8400702}, interhash = {670b0abf93b2e86391df5537717f8794}, intrahash = {58443159d6a52771be860600a362910d}, isbn = {978-1-5386-3728-9}, keywords = {}, pages = {1-10}, publisher = {IEEE}, timestamp = {2023-12-13T00:41:39.000+0100}, title = {Device aging: A reliability and security concern.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2018.html#KraakTHWCCSWK18}, year = 2018 }