%0 Conference Paper %1 conf/irps/LiMWSB15 %A Li, Baozhen %A Muller, K. Paul %A Warnock, James D. %A Sigal, Leon J. %A Badami, Dinesh %B IRPS %D 2015 %I IEEE %K dblp %P 2 %T A case study of electromigration reliability: From design point to system operations. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#LiMWSB15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/LiMWSB15, added-at = {2017-05-21T00:00:00.000+0200}, author = {Li, Baozhen and Muller, K. Paul and Warnock, James D. and Sigal, Leon J. and Badami, Dinesh}, biburl = {https://www.bibsonomy.org/bibtex/260360c4058e16f57b264dc98ed6d48d0/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112680}, interhash = {770ff2e23fae79f95a32289e088c3354}, intrahash = {60360c4058e16f57b264dc98ed6d48d0}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 2, publisher = {IEEE}, timestamp = {2019-10-17T14:45:48.000+0200}, title = {A case study of electromigration reliability: From design point to system operations.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#LiMWSB15}, year = 2015 }