%0 Conference Paper %1 conf/isqed/KrishnappaM11 %A Krishnappa, Shreyas Kumar %A Mahmoodi, Hamid %B ISQED %D 2011 %I IEEE %K dblp %P 384-389 %T Comparative BTI reliability analysis of SRAM cell designs in nano-scale CMOS technology. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2011.html#KrishnappaM11 %@ 978-1-61284-914-0

@inproceedings{conf/isqed/KrishnappaM11, added-at = {2017-05-25T00:00:00.000+0200}, author = {Krishnappa, Shreyas Kumar and Mahmoodi, Hamid}, biburl = {https://www.bibsonomy.org/bibtex/2d908efc4f07981eef2e9aa2832909f3f/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2011}, ee = {https://doi.org/10.1109/ISQED.2011.5770755}, interhash = {7a7baab9e00a7cdff6217947e7447509}, intrahash = {d908efc4f07981eef2e9aa2832909f3f}, isbn = {978-1-61284-914-0}, keywords = {dblp}, pages = {384-389}, publisher = {IEEE}, timestamp = {2017-05-26T13:02:18.000+0200}, title = {Comparative BTI reliability analysis of SRAM cell designs in nano-scale CMOS technology.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2011.html#KrishnappaM11}, year = 2011 }