%0 Journal Article %1 journals/ior/AdamsH97 %A Adams, J. B. %A Hochbaum, Dorit S. %D 1997 %J Operations Research %K dblp %N 6 %P 842-856 %T A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation. %U http://dblp.uni-trier.de/db/journals/ior/ior45.html#AdamsH97 %V 45

@article{journals/ior/AdamsH97, added-at = {2016-04-05T00:00:00.000+0200}, author = {Adams, J. B. and Hochbaum, Dorit S.}, biburl = {https://www.bibsonomy.org/bibtex/2e524ed325af95766f1cceea97540e811/dblp}, ee = {http://dx.doi.org/10.1287/opre.45.6.842}, interhash = {7b3f285c28bef2f2a23bf575175a554a}, intrahash = {e524ed325af95766f1cceea97540e811}, journal = {Operations Research}, keywords = {dblp}, number = 6, pages = {842-856}, timestamp = {2016-04-06T11:38:00.000+0200}, title = {A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation.}, url = {http://dblp.uni-trier.de/db/journals/ior/ior45.html#AdamsH97}, volume = 45, year = 1997 }