%0 Journal Article %1 YUAN2010 %A Yuan, T. %A Bae, S. %A Park, J. %D 2010 %I Springer London %J Int. J.of Advanced Manufacturing Technology %K imported %N 5-8 %P 1--13 %T Bayesian spatial defect pattern recognition in semiconductor fabrication using support vector clustering %U http://dx.doi.org/10.1007/s00170-010-2647-x %V 51

@article{YUAN2010, added-at = {2013-01-07T16:10:56.000+0100}, affiliation = {Ohio University Department of Industrial and Systems Engineering Athens OH USA}, author = {Yuan, T. and Bae, S. and Park, J.}, biburl = {https://www.bibsonomy.org/bibtex/2b642466ac856c3cfa6550f318f0b1097/olivia.bluder}, interhash = {7df00684473d5cd32aaf77780fbb60b2}, intrahash = {b642466ac856c3cfa6550f318f0b1097}, issn = {0268-3768}, journal = {Int. J.of Advanced Manufacturing Technology}, keyword = {Computer Science}, keywords = {imported}, note = {10.1007/s00170-010-2647-x}, number = {5-8}, owner = {bluder}, pages = {1--13}, publisher = {Springer London}, timestamp = {2013-01-07T16:11:13.000+0100}, title = {{B}ayesian spatial defect pattern recognition in semiconductor fabrication using support vector clustering}, url = {http://dx.doi.org/10.1007/s00170-010-2647-x}, volume = 51, year = 2010 }