%0 Journal Article %1 Leijten_2017 %A Leijten, Zino J. W. A. %A Keizer, Arthur D. A. %A de With, Gijsbertus %A Friedrich, Heiner %D 2017 %I American Chemical Society (ACS) %J The Journal of Physical Chemistry C %K TEM organic %N 19 %P 10552--10561 %R 10.1021/acs.jpcc.7b01749 %T Quantitative Analysis of Electron Beam Damage in Organic Thin Films %U https://doi.org/10.1021%2Facs.jpcc.7b01749 %V 121

@article{Leijten_2017, added-at = {2018-05-25T14:02:20.000+0200}, author = {Leijten, Zino J. W. A. and Keizer, Arthur D. A. and de With, Gijsbertus and Friedrich, Heiner}, biburl = {https://www.bibsonomy.org/bibtex/23711678a4217fd5ac9e1dac26d2f6fd5/gmue}, doi = {10.1021/acs.jpcc.7b01749}, interhash = {7ed17accf1e53c600ba65f327cd40aa1}, intrahash = {3711678a4217fd5ac9e1dac26d2f6fd5}, journal = {The Journal of Physical Chemistry C}, keywords = {TEM organic}, month = may, number = 19, pages = {10552--10561}, publisher = {American Chemical Society ({ACS})}, timestamp = {2018-05-25T14:02:20.000+0200}, title = {Quantitative Analysis of Electron Beam Damage in Organic Thin Films}, url = {https://doi.org/10.1021%2Facs.jpcc.7b01749}, volume = 121, year = 2017 }