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%0 Journal Article
%1 Leijten_2017
%A Leijten, Zino J. W. A.
%A Keizer, Arthur D. A.
%A de With, Gijsbertus
%A Friedrich, Heiner
%D 2017
%I American Chemical Society (ACS)
%J The Journal of Physical Chemistry C
%K TEM organic
%N 19
%P 10552--10561
%R 10.1021/acs.jpcc.7b01749
%T Quantitative Analysis of Electron Beam Damage in Organic Thin Films
%U https://doi.org/10.1021%2Facs.jpcc.7b01749
%V 121
@article{Leijten_2017,
added-at = {2018-05-25T14:02:20.000+0200},
author = {Leijten, Zino J. W. A. and Keizer, Arthur D. A. and de With, Gijsbertus and Friedrich, Heiner},
biburl = {https://www.bibsonomy.org/bibtex/23711678a4217fd5ac9e1dac26d2f6fd5/gmue},
doi = {10.1021/acs.jpcc.7b01749},
interhash = {7ed17accf1e53c600ba65f327cd40aa1},
intrahash = {3711678a4217fd5ac9e1dac26d2f6fd5},
journal = {The Journal of Physical Chemistry C},
keywords = {TEM organic},
month = may,
number = 19,
pages = {10552--10561},
publisher = {American Chemical Society ({ACS})},
timestamp = {2018-05-25T14:02:20.000+0200},
title = {Quantitative Analysis of Electron Beam Damage in Organic Thin Films},
url = {https://doi.org/10.1021%2Facs.jpcc.7b01749},
volume = 121,
year = 2017
}
