%0 Conference Paper %1 conf/itc/Cohen86 %A Cohen, Stephen A. %B ITC %D 1986 %I IEEE Computer Society %K dblp %P 763-770 %T A New Pin Electronics Architecture for High Performance Functional Module Testing. %U http://dblp.uni-trier.de/db/conf/itc/itc1986.html#Cohen86

@inproceedings{conf/itc/Cohen86, added-at = {2002-10-22T00:00:00.000+0200}, author = {Cohen, Stephen A.}, biburl = {https://www.bibsonomy.org/bibtex/227ff630e401b57e288f145597d9cbae5/dblp}, booktitle = {ITC}, crossref = {conf/itc/1986}, date = {2002-10-22}, description = {dblp}, interhash = {88a249eb6a3ee3f74150566b82d917db}, intrahash = {27ff630e401b57e288f145597d9cbae5}, keywords = {dblp}, pages = {763-770}, publisher = {IEEE Computer Society}, timestamp = {2002-10-22T00:00:00.000+0200}, title = {A New Pin Electronics Architecture for High Performance Functional Module Testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1986.html#Cohen86}, year = 1986 }