%0 Conference Paper %1 conf/iccd/XueB15 %A Xue, Cheng %A Blanton, R. D. (Shawn) %B ICCD %D 2015 %I IEEE Computer Society %K dblp %P 621-628 %T A one-pass test-selection method for maximizing test coverage. %U http://dblp.uni-trier.de/db/conf/iccd/iccd2015.html#XueB15 %@ 978-1-4673-7166-7

@inproceedings{conf/iccd/XueB15, added-at = {2023-03-23T00:00:00.000+0100}, author = {Xue, Cheng and Blanton, R. D. (Shawn)}, biburl = {https://www.bibsonomy.org/bibtex/2c9060113c0156cb515ddaa63885920b3/dblp}, booktitle = {ICCD}, crossref = {conf/iccd/2015}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICCD.2015.7357173}, interhash = {88a61497345637f5d8baa1fa4398e332}, intrahash = {c9060113c0156cb515ddaa63885920b3}, isbn = {978-1-4673-7166-7}, keywords = {dblp}, pages = {621-628}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:24:29.000+0200}, title = {A one-pass test-selection method for maximizing test coverage.}, url = {http://dblp.uni-trier.de/db/conf/iccd/iccd2015.html#XueB15}, year = 2015 }