%0 Conference Paper %1 conf/irps/SuAJKLLMPPPSSSW18 %A Su, Chen-Yi %A Armstrong, M. %A Jiang, Lei %A Kumar, S. A. %A Landon, C. D. %A Liu, S. %A Meric, Inanc %A Park, K. W. %A Paulson, Leif %A Phoa, K. %A Sell, Bernhard %A Standfest, Jihan %A Sutaria, Ketul B. %A Wan, J. %A Young, D. %A Ramey, Stephen %B IRPS %D 2018 %I IEEE %K dblp %P 6 %T Transistor reliability characterization and modeling of the 22FFL FinFET technology. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#SuAJKLLMPPPSSSW18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/SuAJKLLMPPPSSSW18, added-at = {2023-08-31T00:00:00.000+0200}, author = {Su, Chen-Yi and Armstrong, M. and Jiang, Lei and Kumar, S. A. and Landon, C. D. and Liu, S. and Meric, Inanc and Park, K. W. and Paulson, Leif and Phoa, K. and Sell, Bernhard and Standfest, Jihan and Sutaria, Ketul B. and Wan, J. and Young, D. and Ramey, Stephen}, biburl = {https://www.bibsonomy.org/bibtex/20bba980c18ca662c42b5750fd1d108bd/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353652}, interhash = {8c7b219e56be7dea61333b9851dc2a28}, intrahash = {0bba980c18ca662c42b5750fd1d108bd}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 6, publisher = {IEEE}, timestamp = {2024-04-10T16:54:56.000+0200}, title = {Transistor reliability characterization and modeling of the 22FFL FinFET technology.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#SuAJKLLMPPPSSSW18}, year = 2018 }