%0 Journal Article %1 journals/tcas/GuptaMRZWB16 %A Gupta, Saket %A Monzel, Carl %A Reed, Daniel S. %A Zhang, Yifei %A Winter, Mark %A Buer, Myron %D 2016 %J IEEE Trans. Circuits Syst. I Regul. Pap. %K %N 7 %P 1014-1022 %T Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories. %U http://dblp.uni-trier.de/db/journals/tcas/tcasI63.html#GuptaMRZWB16 %V 63-I

@article{journals/tcas/GuptaMRZWB16, added-at = {2023-12-13T03:33:15.000+0100}, author = {Gupta, Saket and Monzel, Carl and Reed, Daniel S. and Zhang, Yifei and Winter, Mark and Buer, Myron}, biburl = {https://www.bibsonomy.org/bibtex/200044e714a06bbe324b2fc2c8ebf3062/admin}, ee = {https://doi.org/10.1109/TCSI.2016.2556120}, interhash = {8c8520319eaf78e90109d65024ea4d9c}, intrahash = {00044e714a06bbe324b2fc2c8ebf3062}, journal = {IEEE Trans. Circuits Syst. I Regul. Pap.}, keywords = {}, number = 7, pages = {1014-1022}, timestamp = {2023-12-13T03:33:15.000+0100}, title = {Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasI63.html#GuptaMRZWB16}, volume = {63-I}, year = 2016 }