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%0 Conference Paper
%1 conf/ats/EnokimotoWYMSKAF09
%A Enokimoto, Kazunari
%A Wen, Xiaoqing
%A Yamato, Yuta
%A Miyase, Kohei
%A Sone, H.
%A Kajihara, Seiji
%A Aso, Masao
%A Furukawa, Hiroshi
%B Asian Test Symposium
%D 2009
%I IEEE Computer Society
%K dblp
%P 99-104
%T CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing.
%U http://dblp.uni-trier.de/db/conf/ats/ats2009.html#EnokimotoWYMSKAF09
%@ 978-0-7695-3864-8
@inproceedings{conf/ats/EnokimotoWYMSKAF09,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Enokimoto, Kazunari and Wen, Xiaoqing and Yamato, Yuta and Miyase, Kohei and Sone, H. and Kajihara, Seiji and Aso, Masao and Furukawa, Hiroshi},
biburl = {https://www.bibsonomy.org/bibtex/2fc46a0c3596d99c32ef926f77556050c/dblp},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/2009},
ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2009.22},
interhash = {8d166e05aee68842ad516b7340d80cb1},
intrahash = {fc46a0c3596d99c32ef926f77556050c},
isbn = {978-0-7695-3864-8},
keywords = {dblp},
pages = {99-104},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T06:37:09.000+0200},
title = {CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#EnokimotoWYMSKAF09},
year = 2009
}