%0 Conference Paper %1 conf/itc/FujiiA86 %A Fujii, Robert H. %A Abraham, Jacob A. %B ITC %D 1986 %I IEEE Computer Society %K dblp %P 480-483 %T Approaches to Circuit Level Design for Testability. %U http://dblp.uni-trier.de/db/conf/itc/itc1986.html#FujiiA86

@inproceedings{conf/itc/FujiiA86, added-at = {2002-10-22T00:00:00.000+0200}, author = {Fujii, Robert H. and Abraham, Jacob A.}, biburl = {https://www.bibsonomy.org/bibtex/252d59c66e3d97c91e227f3bf05c3e4b6/dblp}, booktitle = {ITC}, crossref = {conf/itc/1986}, date = {2002-10-22}, description = {dblp}, interhash = {8ecb17e56c579671c9931a88ba0ec497}, intrahash = {52d59c66e3d97c91e227f3bf05c3e4b6}, keywords = {dblp}, pages = {480-483}, publisher = {IEEE Computer Society}, timestamp = {2002-10-22T00:00:00.000+0200}, title = {Approaches to Circuit Level Design for Testability.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1986.html#FujiiA86}, year = 1986 }