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%0 Conference Paper
%1 conf/ets/InoueTYIF10
%A Inoue, Michiko
%A Taketani, Akira
%A Yoneda, Tomokazu
%A Iwata, Hiroshi
%A Fujiwara, Hideo
%B European Test Symposium
%D 2010
%I IEEE Computer Society
%K dblp
%P 260
%T Test pattern selection to optimize delay test quality with a limited size of test set.
%U http://dblp.uni-trier.de/db/conf/ets/ets2010.html#InoueTYIF10
%@ 978-1-4244-5833-2
@inproceedings{conf/ets/InoueTYIF10,
added-at = {2017-05-22T00:00:00.000+0200},
author = {Inoue, Michiko and Taketani, Akira and Yoneda, Tomokazu and Iwata, Hiroshi and Fujiwara, Hideo},
biburl = {https://www.bibsonomy.org/bibtex/232ca8baa25360129e7f7512ad5d0400f/dblp},
booktitle = {European Test Symposium},
crossref = {conf/ets/2010},
ee = {https://doi.org/10.1109/ETSYM.2010.5512733},
interhash = {95430d2d5c30dbf04a1aa57c18bd07cd},
intrahash = {32ca8baa25360129e7f7512ad5d0400f},
isbn = {978-1-4244-5833-2},
keywords = {dblp},
pages = 260,
publisher = {IEEE Computer Society},
timestamp = {2019-10-17T15:59:35.000+0200},
title = {Test pattern selection to optimize delay test quality with a limited size of test set.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2010.html#InoueTYIF10},
year = 2010
}