%0 Journal Article %1 nieuwhof1975introduction %A Nieuwhof, G.W.E. %D 1975 %J Microelectronics Reliability %K 62n05-reliability-and-life-testing fault-tree-analysis %N 2 %P 105-119 %R 10.1016/0026-2714(75)90024-4 %T An introduction to fault tree analysis with emphasis on failure rate evaluation %U https://www.sciencedirect.com/science/article/pii/0026271475900244 %V 14 %X The construction criteria and the two major evaluation methods of fault trees are briefly discussed. The equations of the basic logic units (OR-gate and AND-gate) of the tree are derived. The probability evaluation and the failure rate evaluation methods are each illustrated by means of a simple example. The effect of active redundancy on the failure rate of a system and its calculation methods are discussed in more detail.

@article{nieuwhof1975introduction, abstract = {The construction criteria and the two major evaluation methods of fault trees are briefly discussed. The equations of the basic logic units (OR-gate and AND-gate) of the tree are derived. The probability evaluation and the failure rate evaluation methods are each illustrated by means of a simple example. The effect of active redundancy on the failure rate of a system and its calculation methods are discussed in more detail.}, added-at = {2023-12-22T01:59:38.000+0100}, author = {Nieuwhof, G.W.E.}, biburl = {https://www.bibsonomy.org/bibtex/2f0794cd7202a839f0491e3d216bda7b2/gdmcbain}, doi = {10.1016/0026-2714(75)90024-4}, interhash = {954a9e2131d7dd075cfde774dc002f6d}, intrahash = {f0794cd7202a839f0491e3d216bda7b2}, issn = {0026-2714}, journal = {Microelectronics Reliability}, keywords = {62n05-reliability-and-life-testing fault-tree-analysis}, number = 2, pages = {105-119}, timestamp = {2023-12-22T01:59:38.000+0100}, title = {An introduction to fault tree analysis with emphasis on failure rate evaluation}, url = {https://www.sciencedirect.com/science/article/pii/0026271475900244}, volume = 14, year = 1975 }