%0 Journal Article %1 journals/iet-cds/AghababaKAFP12 %A Aghababa, Hossein %A Khosropour, Alireza %A Afzali-Kusha, Ali %A Forouzandeh, Behjat %A Pedram, Massoud %D 2012 %J IET Circuits Devices Syst. %K dblp %N 5 %P 273-278 %T Statistical estimation of leakage power dissipation in nano-scale complementary metal oxide semiconductor digital circuits using generalised extreme value distribution. %U http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds6.html#AghababaKAFP12 %V 6

@article{journals/iet-cds/AghababaKAFP12, added-at = {2020-09-10T00:00:00.000+0200}, author = {Aghababa, Hossein and Khosropour, Alireza and Afzali-Kusha, Ali and Forouzandeh, Behjat and Pedram, Massoud}, biburl = {https://www.bibsonomy.org/bibtex/2cc233833252e3311e3ed9deee129ffc7/dblp}, ee = {https://doi.org/10.1049/iet-cds.2011.0348}, interhash = {9a73cea5ed9d7cfc1eeaaaa22f0995bc}, intrahash = {cc233833252e3311e3ed9deee129ffc7}, journal = {IET Circuits Devices Syst.}, keywords = {dblp}, number = 5, pages = {273-278}, timestamp = {2020-09-11T11:44:09.000+0200}, title = {Statistical estimation of leakage power dissipation in nano-scale complementary metal oxide semiconductor digital circuits using generalised extreme value distribution.}, url = {http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds6.html#AghababaKAFP12}, volume = 6, year = 2012 }