Meta data
- BibTeX key
- conf/cscwd/YueWGXZ23
- entry type
- inproceedings
- booktitle
- CSCWD
- year
- 2023
- pages
- 1667-1672
- publisher
- IEEE
- crossref
- conf/cscwd/2023
- ee
- https://doi.org/10.1109/CSCWD57460.2023.10152825
- isbn
- 979-8-3503-3168-4
- url
- http://dblp.uni-trier.de/db/conf/cscwd/cscwd2023.html#YueWGXZ23
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- please select -%0 Conference Paper
%1 conf/cscwd/YueWGXZ23
%A Yue, Han
%A Wang, Rucen
%A Gao, Yi
%A Xia, Ailing
%A Zhang, Jianhua
%B CSCWD
%D 2023
%E Shen, Weiming
%E Barthès, Jean-Paul A.
%E Luo, Junzhou
%E Vivacqua, Adriana S.
%E Schneider, Daniel
%E Xie, Cheng
%E Zhang, Jinghui
%E Zhu, Haibin
%E Peng, Kunkun
%E da Motta, Cláudia Lage Rebello
%I IEEE
%K dblp
%P 1667-1672
%T DSP-Based Industrial Defect Detection for Intelligent Manufacturing.
%U http://dblp.uni-trier.de/db/conf/cscwd/cscwd2023.html#YueWGXZ23
%@ 979-8-3503-3168-4
@inproceedings{conf/cscwd/YueWGXZ23,
added-at = {2023-08-05T00:00:00.000+0200},
author = {Yue, Han and Wang, Rucen and Gao, Yi and Xia, Ailing and Zhang, Jianhua},
biburl = {https://www.bibsonomy.org/bibtex/2dcba9b57c8b5ff53a7befacdae47bddb/dblp},
booktitle = {CSCWD},
crossref = {conf/cscwd/2023},
editor = {Shen, Weiming and Barthès, Jean-Paul A. and Luo, Junzhou and Vivacqua, Adriana S. and Schneider, Daniel and Xie, Cheng and Zhang, Jinghui and Zhu, Haibin and Peng, Kunkun and da Motta, Cláudia Lage Rebello},
ee = {https://doi.org/10.1109/CSCWD57460.2023.10152825},
interhash = {9e37ea4bb199552923acda30d4643c72},
intrahash = {dcba9b57c8b5ff53a7befacdae47bddb},
isbn = {979-8-3503-3168-4},
keywords = {dblp},
pages = {1667-1672},
publisher = {IEEE},
timestamp = {2024-08-05T07:14:38.000+0200},
title = {DSP-Based Industrial Defect Detection for Intelligent Manufacturing.},
url = {http://dblp.uni-trier.de/db/conf/cscwd/cscwd2023.html#YueWGXZ23},
year = 2023
}