%0 Conference Paper %1 conf/itc/KolpekwarB97 %A Kolpekwar, Abhijeet %A Blanton, Ronald D. %B ITC %D 1997 %I IEEE Computer Society %K dblp %P 923-931 %T Development of a MEMS Testing Methodology. %U http://dblp.uni-trier.de/db/conf/itc/itc1997.html#KolpekwarB97 %@ 0-7803-4209-7

@inproceedings{conf/itc/KolpekwarB97, added-at = {2023-03-23T00:00:00.000+0100}, author = {Kolpekwar, Abhijeet and Blanton, Ronald D.}, biburl = {https://www.bibsonomy.org/bibtex/2cc4926dcabe8a46efc15ab2461e2b83e/dblp}, booktitle = {ITC}, crossref = {conf/itc/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1997.639707}, interhash = {9f436706454884412fd9b04d8bd3251b}, intrahash = {cc4926dcabe8a46efc15ab2461e2b83e}, isbn = {0-7803-4209-7}, keywords = {dblp}, pages = {923-931}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:11.000+0200}, title = {Development of a MEMS Testing Methodology.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1997.html#KolpekwarB97}, year = 1997 }