%0 Conference Paper %1 conf/iccad2/TchatchouaGOMTJ22 %A Tchatchoua, Philip %A Graton, Guillaume %A Ouladsine, Mustapha %A Muller, Julien %A Traoré, Abraham %A Juge, Michel %B ICCAD %D 2022 %I IEEE %K dblp %P 1-6 %T 1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing. %U http://dblp.uni-trier.de/db/conf/iccad2/iccad2022.html#TchatchouaGOMTJ22 %@ 978-1-6654-9794-7

@inproceedings{conf/iccad2/TchatchouaGOMTJ22, added-at = {2023-04-25T00:00:00.000+0200}, author = {Tchatchoua, Philip and Graton, Guillaume and Ouladsine, Mustapha and Muller, Julien and Traoré, Abraham and Juge, Michel}, biburl = {https://www.bibsonomy.org/bibtex/2787e65658d838dc15d1f33ff39114e8e/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad2/2022}, ee = {https://doi.org/10.1109/ICCAD55197.2022.9853997}, interhash = {a06ca17709be97e22f95b829abb795e3}, intrahash = {787e65658d838dc15d1f33ff39114e8e}, isbn = {978-1-6654-9794-7}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T10:12:10.000+0200}, title = {1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing.}, url = {http://dblp.uni-trier.de/db/conf/iccad2/iccad2022.html#TchatchouaGOMTJ22}, year = 2022 }