%0 Journal Article %1 journals/mr/ZhangFZZD13 %A Zhang, Yamin %A Feng, Shiwei %A Zhu, Hui %A Zhang, Jianwei %A Deng, Bing %D 2013 %J Microelectron. Reliab. %K dblp %N 5 %P 694-700 %T Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#ZhangFZZD13 %V 53

@article{journals/mr/ZhangFZZD13, added-at = {2023-03-15T00:00:00.000+0100}, author = {Zhang, Yamin and Feng, Shiwei and Zhu, Hui and Zhang, Jianwei and Deng, Bing}, biburl = {https://www.bibsonomy.org/bibtex/2334715b8ea6faeb4883a8175db6db118/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.02.004}, interhash = {a442488b7c2aa38f786d95dc6594254f}, intrahash = {334715b8ea6faeb4883a8175db6db118}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 5, pages = {694-700}, timestamp = {2024-04-09T02:48:51.000+0200}, title = {Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#ZhangFZZD13}, volume = 53, year = 2013 }