%0 Conference Paper %1 conf/iccad/NagiCBA93 %A Nagi, Naveena %A Chatterjee, Abhijit %A Balivada, Ashok %A Abraham, Jacob A. %B ICCAD %D 1993 %E Lightner, Michael R. %E Jess, Jochen A. G. %I IEEE Computer Society / ACM %K dblp %P 88-91 %T Fault-based automatic test generator for linear analog circuits. %U http://dblp.uni-trier.de/db/conf/iccad/iccad1993.html#NagiCBA93 %@ 0-8186-4490-7

@inproceedings{conf/iccad/NagiCBA93, added-at = {2023-03-24T00:00:00.000+0100}, author = {Nagi, Naveena and Chatterjee, Abhijit and Balivada, Ashok and Abraham, Jacob A.}, biburl = {https://www.bibsonomy.org/bibtex/2d2e992830d5308ea440b031c3f26427a/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/1993}, editor = {Lightner, Michael R. and Jess, Jochen A. G.}, ee = {https://dl.acm.org/citation.cfm?id=259809}, interhash = {aad7d868aa29ac61f1e58c4ab12a1ec2}, intrahash = {d2e992830d5308ea440b031c3f26427a}, isbn = {0-8186-4490-7}, keywords = {dblp}, pages = {88-91}, publisher = {IEEE Computer Society / ACM}, timestamp = {2024-04-10T20:50:30.000+0200}, title = {Fault-based automatic test generator for linear analog circuits.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad1993.html#NagiCBA93}, year = 1993 }