%0 Journal Article %1 journals/tvlsi/GuinZS18 %A Guin, Ujjwal %A Zhou, Ziqi %A Singh, Adit D. %D 2018 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 5 %P 818-830 %T Robust Design-for-Security Architecture for Enabling Trust in IC Manufacturing and Test. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi26.html#GuinZS18 %V 26

@article{journals/tvlsi/GuinZS18, added-at = {2020-03-11T00:00:00.000+0100}, author = {Guin, Ujjwal and Zhou, Ziqi and Singh, Adit D.}, biburl = {https://www.bibsonomy.org/bibtex/2efacebaeaa5daab1ec3e6c0fc456ff00/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2018.2797019}, interhash = {b6c87e01647e1461376d81ec5840affa}, intrahash = {efacebaeaa5daab1ec3e6c0fc456ff00}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 5, pages = {818-830}, timestamp = {2020-03-12T11:44:31.000+0100}, title = {Robust Design-for-Security Architecture for Enabling Trust in IC Manufacturing and Test.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi26.html#GuinZS18}, volume = 26, year = 2018 }