%0 Conference Paper %1 conf/sc2/ChenLW17 %A Chen, Shao-Jui %A Liu, Hsueh-Wen %A Wang, Wei-Jen %B SC² %D 2017 %I IEEE Computer Society %K dblp %P 171-176 %T A Fault Tolerance Mechanism for Semiconductor Equipment Monitoring. %U http://dblp.uni-trier.de/db/conf/sc2/sc22017.html#ChenLW17 %@ 978-1-5386-5862-8

@inproceedings{conf/sc2/ChenLW17, added-at = {2023-03-24T00:00:00.000+0100}, author = {Chen, Shao-Jui and Liu, Hsueh-Wen and Wang, Wei-Jen}, biburl = {https://www.bibsonomy.org/bibtex/2403587a2b55217bf61e17875c664443d/dblp}, booktitle = {SC²}, crossref = {conf/sc2/2017}, ee = {https://doi.ieeecomputersociety.org/10.1109/SC2.2017.33}, interhash = {ba9f46c96b710a691c6eb1ae770ed104}, intrahash = {403587a2b55217bf61e17875c664443d}, isbn = {978-1-5386-5862-8}, keywords = {dblp}, pages = {171-176}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:09:31.000+0200}, title = {A Fault Tolerance Mechanism for Semiconductor Equipment Monitoring.}, url = {http://dblp.uni-trier.de/db/conf/sc2/sc22017.html#ChenLW17}, year = 2017 }