%0 Journal Article %1 journals/sensors/ChenLS20 %A Chen, Xue %A Li, Jiaqi %A Sui, Yongxin %D 2020 %J Sensors %K dblp %N 2 %P 448 %T A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction. %U http://dblp.uni-trier.de/db/journals/sensors/sensors20.html#ChenLS20 %V 20

@article{journals/sensors/ChenLS20, added-at = {2020-05-30T00:00:00.000+0200}, author = {Chen, Xue and Li, Jiaqi and Sui, Yongxin}, biburl = {https://www.bibsonomy.org/bibtex/2e6b8e13719d5eee35f1fc1f7888e5b7a/dblp}, ee = {https://www.wikidata.org/entity/Q92663790}, interhash = {bd5e357f352c770f8887bc27143f04f5}, intrahash = {e6b8e13719d5eee35f1fc1f7888e5b7a}, journal = {Sensors}, keywords = {dblp}, number = 2, pages = 448, timestamp = {2020-06-02T12:12:38.000+0200}, title = {A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction.}, url = {http://dblp.uni-trier.de/db/journals/sensors/sensors20.html#ChenLS20}, volume = 20, year = 2020 }