%0 Conference Paper %1 conf/dft/ChapmanPLKK17 %A Chapman, Glenn H. %A Purbakht, Parham %A Le, Peter %A Koren, Israel %A Koren, Zahava %B DFT %D 2017 %I IEEE Computer Society %K dblp %P 1-4 %T Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. %U http://dblp.uni-trier.de/db/conf/dft/dft2017.html#ChapmanPLKK17 %@ 978-1-5386-0362-8

@inproceedings{conf/dft/ChapmanPLKK17, added-at = {2023-03-24T00:00:00.000+0100}, author = {Chapman, Glenn H. and Purbakht, Parham and Le, Peter and Koren, Israel and Koren, Zahava}, biburl = {https://www.bibsonomy.org/bibtex/2ecc882d63e3364c6672856dd081106ff/dblp}, booktitle = {DFT}, crossref = {conf/dft/2017}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFT.2017.8244457}, interhash = {c5205956a4e653218f1139d72168b267}, intrahash = {ecc882d63e3364c6672856dd081106ff}, isbn = {978-1-5386-0362-8}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:57:26.000+0200}, title = {Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2017.html#ChapmanPLKK17}, year = 2017 }