%0 Journal Article %1 journals/dt/YericCGDSG05 %A Yeric, Greg %A Cohen, Ethan %A Garcia, John %A Davis, Kurt %A Salem, Esam %A Green, Gary %D 2005 %J IEEE Des. Test Comput. %K dblp %N 3 %P 232-239 %T Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below. %U http://dblp.uni-trier.de/db/journals/dt/dt22.html#YericCGDSG05 %V 22

@article{journals/dt/YericCGDSG05, added-at = {2020-05-17T00:00:00.000+0200}, author = {Yeric, Greg and Cohen, Ethan and Garcia, John and Davis, Kurt and Salem, Esam and Green, Gary}, biburl = {https://www.bibsonomy.org/bibtex/247cc39fb26b6a3a97adf0ffcff521ad1/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.63}, interhash = {c62039ad592da3130d35b18e218899ef}, intrahash = {47cc39fb26b6a3a97adf0ffcff521ad1}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 3, pages = {232-239}, timestamp = {2020-05-19T12:19:30.000+0200}, title = {Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt22.html#YericCGDSG05}, volume = 22, year = 2005 }