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%0 Conference Paper
%1 conf/ets/CosterHPSCMACB16
%A Coster, Jeroen De
%A Heyn, Peter De
%A Pantouvaki, Marianna
%A Snyder, Brad
%A Chen, Hongtao
%A Marinissen, Erik Jan
%A Absil, Philippe
%A Campenhout, Joris Van
%A Bolt, Bryan
%B ETS
%D 2016
%I IEEE
%K dblp
%P 1-6
%T Test-station for flexible semi-automatic wafer-level silicon photonics testing.
%U http://dblp.uni-trier.de/db/conf/ets/ets2016.html#CosterHPSCMACB16
%@ 978-1-4673-9659-2
@inproceedings{conf/ets/CosterHPSCMACB16,
added-at = {2024-02-05T00:00:00.000+0100},
author = {Coster, Jeroen De and Heyn, Peter De and Pantouvaki, Marianna and Snyder, Brad and Chen, Hongtao and Marinissen, Erik Jan and Absil, Philippe and Campenhout, Joris Van and Bolt, Bryan},
biburl = {https://www.bibsonomy.org/bibtex/27a801a3df5d53a6927389946a3e47e0c/dblp},
booktitle = {ETS},
crossref = {conf/ets/2016},
ee = {https://doi.org/10.1109/ETS.2016.7519306},
interhash = {c8166def04fc759ee5ab3ec7b0ae3a6c},
intrahash = {7a801a3df5d53a6927389946a3e47e0c},
isbn = {978-1-4673-9659-2},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-10T20:48:33.000+0200},
title = {Test-station for flexible semi-automatic wafer-level silicon photonics testing.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2016.html#CosterHPSCMACB16},
year = 2016
}