%0 Journal Article %1 journals/dt/WangC17 %A Wang, Ran %A Chakrabarty, Krishnendu %D 2017 %J IEEE Des. Test %K dblp %N 5 %P 72-79 %T Tackling Test Challenges for Interposer-Based 2.5-D Integrated Circuits. %U http://dblp.uni-trier.de/db/journals/dt/dt34.html#WangC17 %V 34

@article{journals/dt/WangC17, added-at = {2020-03-13T00:00:00.000+0100}, author = {Wang, Ran and Chakrabarty, Krishnendu}, biburl = {https://www.bibsonomy.org/bibtex/27792f1284df6445f19fc410a48728c37/dblp}, ee = {https://doi.org/10.1109/MDAT.2017.2705077}, interhash = {c8df29941d7e2381e405956841ededdd}, intrahash = {7792f1284df6445f19fc410a48728c37}, journal = {IEEE Des. Test}, keywords = {dblp}, number = 5, pages = {72-79}, timestamp = {2020-03-14T12:05:40.000+0100}, title = {Tackling Test Challenges for Interposer-Based 2.5-D Integrated Circuits.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt34.html#WangC17}, volume = 34, year = 2017 }