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- BibTeX key
- conf/itc/LinCYCH10
- entry type
- inproceedings
- booktitle
- ITC
- year
- 2010
- pages
- 427-436
- publisher
- IEEE Computer Society
- crossref
- conf/itc/2010
- ee
- https://doi.ieeecomputersociety.org/10.1109/TEST.2010.5699245
- isbn
- 978-1-4244-7206-2
- url
- http://dblp.uni-trier.de/db/conf/itc/itc2010.html#LinCYCH10
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- please select -%0 Conference Paper
%1 conf/itc/LinCYCH10
%A Lin, Chen-Wei
%A Chen, Hung-Hsin
%A Yang, Hao-Yu
%A Chao, Mango Chia-Tso
%A Huang, Rei-Fu
%B ITC
%D 2010
%E Press, Ron
%E Volkerink, Erik H.
%I IEEE Computer Society
%K dblp
%P 427-436
%T Fault models and test methods for subthreshold SRAMs.
%U http://dblp.uni-trier.de/db/conf/itc/itc2010.html#LinCYCH10
%@ 978-1-4244-7206-2
@inproceedings{conf/itc/LinCYCH10,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Lin, Chen-Wei and Chen, Hung-Hsin and Yang, Hao-Yu and Chao, Mango Chia-Tso and Huang, Rei-Fu},
biburl = {https://www.bibsonomy.org/bibtex/2a3359f96c985313da093e2c12899fbf9/dblp},
booktitle = {ITC},
crossref = {conf/itc/2010},
editor = {Press, Ron and Volkerink, Erik H.},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2010.5699245},
interhash = {cac9e93ce16c560e8272f1cb8b24ad47},
intrahash = {a3359f96c985313da093e2c12899fbf9},
isbn = {978-1-4244-7206-2},
keywords = {dblp},
pages = {427-436},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:27:14.000+0200},
title = {Fault models and test methods for subthreshold SRAMs.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2010.html#LinCYCH10},
year = 2010
}